• DocumentCode
    1933475
  • Title

    Design of tri-reflector compact antenna test range from 40GHz to 100GHz

  • Author

    Lu, Ze Jian ; Xiao Dong Chen ; Yu, Jun Sheng ; Yao, Yuan ; Yang, Cheng ; Ge, Hong Bin

  • Author_Institution
    Sch. of Electron. Eng., Beijing Univ. of Post & Telecommun., Beijing, China
  • fYear
    2012
  • fDate
    18-20 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Compact antenna test range (CATR) technology is key measurement technologies of antenna and target specific areas. Tri-reflector compact antenna test range is a promising solution of high frequency compact range systems. The system uses two shaped-reflectors as the feed system, making the quiet zone utilization significantly improved. A tri-reflector compact antenna test range system operating from 40GHz to 100GHz is designed and simulated in this paper. In order to reduce edge diffraction effect, the author proposes a series of measures to improve the performance. Simulation result in GRASP shows that within the quiet zone, the amplitude ripple is less than 1dB; phase ripple is less than 10 degree; x-polar isolation is greater than 30dB and the quiet zone usage is up to 70%. The system performance can meet system requirement very well. To provide guidance to system manufacture and calibration, much effort is put into system parameter studies and sensitivity analysis.
  • Keywords
    antenna testing; millimetre wave antennas; reflector antenna feeds; sensitivity analysis; CATR technology; GRASP simulation; X-polar isolation; amplitude ripple; antenna measurement technology; calibration; edge diffraction effect reduction; feed system; frequency 40 GHz to 100 GHz; quiet zone utilization; sensitivity analysis; shaped-reflectors; solution of high frequency compact range systems; system manufacture; trireflector compact antenna test range design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Workshop Series on Millimeter Wave Wireless Technology and Applications (IMWS), 2012 IEEE MTT-S International
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4673-0901-1
  • Electronic_ISBN
    978-1-4673-0903-5
  • Type

    conf

  • DOI
    10.1109/IMWS2.2012.6338177
  • Filename
    6338177