• DocumentCode
    1933583
  • Title

    Byzantine Anomaly Testing for Charm++: Providing Fault Tolerance and Survivability for Charm++ Empowered Clusters

  • Author

    Mogilevsky, Dmitry ; Koenig, Gregory A. ; Yurcik, William

  • Author_Institution
    Dept. of Comput. Sci., Illinois Univ., Urbana, IL
  • Volume
    2
  • fYear
    2006
  • fDate
    16-19 May 2006
  • Firstpage
    30
  • Lastpage
    30
  • Abstract
    Recently shifts in high-performance computing have increased the use of clusters built around cheap commodity processors. A typical cluster consists of individual nodes, containing one or several processors, connected together with a high-bandwidth, low-latency interconnect. There are many benefits to using clusters for computation, but also some drawbacks, including a tendency to exhibit low Mean Time To Failure (MTTF) due to the sheer number of components involved. Recently, a number of fault-tolerance techniques have been proposed and developed to mitigate the inherent unreliability of clusters. These techniques, however, fail to address the issue of detecting non-obvious faults, particularly Byzantine faults. At present, effectively detecting Byzantine faults is an open problem. We describe the operation of ByzwATCh, a module for run-time detecting Byzantine hardware errors as part of the Charm++ parallel programming framework
  • Keywords
    fault tolerant computing; object-oriented languages; parallel languages; parallel programming; program testing; workstation clusters; Byzantine anomaly testing; Byzantine faults detection; Byzantine hardware errors; ByzwATCh; Charm++ empowered clusters; Charm++ parallel programming; fault tolerance; high-bandwidth low-latency interconnect; high-performance computing; Application software; Computer architecture; Computer science; Fault detection; Fault tolerance; Geophysics computing; Hardware; Parallel programming; Runtime; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cluster Computing and the Grid, 2006. CCGRID 06. Sixth IEEE International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    0-7695-2585-7
  • Type

    conf

  • DOI
    10.1109/CCGRID.2006.1630925
  • Filename
    1630925