• DocumentCode
    1933645
  • Title

    Digital imaging in radiology: preliminary results obtained with a high spatial resolution 2D silicon detector

  • Author

    Alfano, B. ; Bandettini, A. ; Bencivelli, W. ; Bertolucci, E. ; Bottigli, U. ; Conti, M. ; Del Guerra, A. ; Fantacci, M.E. ; Gambaccini, M. ; Larobina, M. ; Marziani, M. ; Randaccio, P. ; Rosso, V. ; Russo, P. ; Stefanini, A.

  • Author_Institution
    Istituto per lo Studio dei Tumori Fondazione, Napoli, Italy
  • fYear
    1992
  • fDate
    25-31 Oct 1992
  • Firstpage
    1301
  • Abstract
    Double-sided microstrip silicon crystals are being tested as detectors for X-rays in the diagnostic energy range (10-100 keV) for digital radiology. An analog-to-digital-converter and CAMAC based acquisition system has been developed to study the imaging capabilities of a silicon microstrip detector with 100 and 200 μm read-out pitch. The authors present the first images of submillimeter high-contrast phantoms obtained with an X-ray mammography tube operating at high flux density. A preliminary contrast transfer function study was performed; a low frequency contrast of about 0.97 for a high-contrast phantom and a decrease of contrast at a frequency of 5 1p/mm corresponding to the detector intrinsic spatial resolution (100 μm) were measured
  • Keywords
    X-ray detection and measurement; biomedical equipment; diagnostic radiography; 10 to 100 keV; CAMAC based acquisition system; Si; Si microstrip detector; X-ray mammography tube; analog-to-digital-converter; contrast transfer function; detector intrinsic spatial resolution; diagnostic X-ray detectors; digital radiological imaging; high spatial resolution 2D Si detector; high-contrast phantom; low frequency contrast; read-out pitch; Crystals; Detectors; Digital images; Frequency; Imaging phantoms; Microstrip; Radiology; Silicon; Testing; X-rays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-0884-0
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1992.301517
  • Filename
    301517