DocumentCode
1933949
Title
Dynamic characterization of parallel-connected high-power IGBT modules
Author
Nan Chen ; Chimento, Filippo ; Nawaz, Muhammad ; Liwei Wang
Author_Institution
ABB Corp. Res., Västerås, Sweden
fYear
2013
fDate
15-19 Sept. 2013
Firstpage
4263
Lastpage
4269
Abstract
In high power converter design, IGBT modules are often operated in parallel to reach high output currents. Evaluating the electrical and thermal behaviour of the paralleling IGBTs is crucial for the design and reliable operation of converter systems. This paper investigates the static and dynamic characterization of paralleling IGBTs and the influence of the electrical parameters on the IGBT behaviour. Si based IGBT power modules with voltage rating of 4.5kV and current rating of 1 kA are used for the experimental evaluation of module parallel connections. Parallel connected modules have been driven by several commercial IGBT gate units at various DC-link voltages and current levels and with different temperatures. The tested IGBT gate units show good current sharing performance between the two parallel modules. Other important influencing factors such as busbar design layout, stray inductance variation and gate driving are also investigated for parallel connections of IGBT modules. Finally, the switching energy of the paralleling modules is extracted for IGBTs and diodes under different conditions.
Keywords
design engineering; insulated gate bipolar transistors; power convertors; power semiconductor switches; reliability; DC-link voltages; IGBT gate units; busbar design layout; converter system operation reliability; current 1 kA; current levels; dynamic characterization; electrical behaviour evaluation; electrical parameters; gate driving; high power converter design; high power insulated gate bipolar transistors; parallel-connected high-power IGBT modules; silicon based IGBT power modules; stray inductance variation; switching energy; thermal behaviour evaluation; voltage 4.5 kV; voltage rating; Inductance; Insulated gate bipolar transistors; Integrated circuits; Logic gates; Semiconductor diodes; Switches; Switching loss; Dynamic characterization; Gate driving; High power converter; IGBTs; Parallel connection; Power module;
fLanguage
English
Publisher
ieee
Conference_Titel
Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/ECCE.2013.6647270
Filename
6647270
Link To Document