Title :
Series resistance effects on EPROM programming
Author :
Bez, R. ; Cantarelli, D. ; Cappelletti, P. ; Maurelli, A. ; Ravazzi, L.
Author_Institution :
SGS-Thomson Microelectronics, 20041 Agrate MI, Italy
Abstract :
An extensive characterization of the influence of series resistance on programming of 1.0¿m technology EPROM cells is presented. The different effects of series resistances on the source or on the drain have been pointed out. Furthermore a simple analytical model has been developed to simulate the influences on the programming.
Keywords :
Analytical models; Capacitance measurement; Current measurement; EPROM; Electrical resistance measurement; Functional programming; Length measurement; Threshold voltage; Time measurement; Velocity measurement;
Conference_Titel :
Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
Conference_Location :
Nottingham, England
