DocumentCode
1934218
Title
Technology assessment for MRAM cells with magnet/semiconductor bits
Author
Boeve, H. ; Das, J. ; Lagae, L. ; Peumans, P. ; Bruynseraede, C. ; Dessein, K. ; Melo, L.V. ; Sousa, R.C. ; Freitas, P.P. ; Borghs, G. ; De Boeck, J.
Author_Institution
IMEC
fYear
1999
fDate
18-21 May 1999
Keywords
Circuit testing; Magnetic circuits; Magnetic semiconductors; Magnetic switching; Magnetic tunneling; Schottky diodes; Semiconductor device testing; Semiconductor diodes; Switches; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-5555-5
Type
conf
DOI
10.1109/INTMAG.1999.837839
Filename
837839
Link To Document