Technology assessment for MRAM cells with magnet/semiconductor bits
Author :
Boeve, H. ; Das, J. ; Lagae, L. ; Peumans, P. ; Bruynseraede, C. ; Dessein, K. ; Melo, L.V. ; Sousa, R.C. ; Freitas, P.P. ; Borghs, G. ; De Boeck, J.
Author_Institution :
IMEC
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Circuit testing; Magnetic circuits; Magnetic semiconductors; Magnetic switching; Magnetic tunneling; Schottky diodes; Semiconductor device testing; Semiconductor diodes; Switches; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
