Title :
High-index-contrast bend structures for microphotonics
Author_Institution :
Microelectronics Sci. Labs., Columbia Univ., New York, NY, USA
Abstract :
Summary form only given. Bending or redirecting light beams is a crucial enabling function for passive integrated optical circuits. The efficiency and scaling properties of bends control the size and, therefore, the practicality of optical integration. In this talk, a review and comparison of the various design options for fabricating high-efficiency bends in high-index-contrast, integrated optical materials. Bend or "turning" designs using measured results with devices fabricated in the silicon-on-insulator material system are illustrated. The computational work has typically been done using FTDT. Particularly, this study compares two types of 90° bending mirror over a range of dimensions for using simulation and experiments. Results show that etched turning mirrors, which are also one of the earliest solutions to 90° bends, are one of the easiest and most efficient to implement. More advanced active devices for angular deflection are also examined and discussed.
Keywords :
bending; finite difference time-domain analysis; integrated optics; integrated optoelectronics; laser beams; micro-optics; mirrors; optical design techniques; optical fabrication; optical materials; refractive index; silicon-on-insulator; waveguide discontinuities; 90/spl deg/ bending mirror; 90/spl deg/ bends; FTDT; angular deflection; bend designs; etched turning mirrors; high-efficiency bends; high-index-contrast bend structures; integrated optical circuits; integrated optical materials; light beams; microphotonics; optical integration; scaling properties; silicon-on-insulator material system; turning designs; Computational modeling; Integrated circuit measurements; Integrated optics; Mirrors; Optical control; Optical design; Optical materials; Silicon on insulator technology; Size control;
Conference_Titel :
Holey Fibers and Photonic Crystals/Polarization Mode Dispersion/Photonics Time/Frequency Measurement and Control, 2003 Digest of the LEOS Summer Topical Meetings
Conference_Location :
Vancouver, BC, Canada
Print_ISBN :
0-7803-7982-9
DOI :
10.1109/LEOSST.2003.1224252