Title :
Inter turn short fault model of PMSMs with series and parallel winding connection
Author :
Bon-Gwan Gu ; Jun-Hyuk Choi ; In-Soung Jung
Author_Institution :
Korea Electron. Technol. Inst., Bucheon, South Korea
Abstract :
Inter turn short fault models of permanent magnet synchronous motors (PMSM) having series and parallel winding connection are proposed using the deformed flux model. The deformed flux model includes not only the fault winding flux information but also the inductance variation by cross flux linkage effect depending on the same phase winding distribution. The series winding PMSM model has forth order dynamics by adding the fault winding dynamics into the three phase winding dynamics. For the parallel winding PMSM model, one dynamics is added to describe the different current distribution by the parallel connection of the fault winding and the healthy winding. With the deformed flux model and the positive sequence current assumption, the proposed model is derived in the positive and negative sequence synchronous reference frame (SRF). The finite elements method (FEM) simulation is applied to validate the proposed PMSM model with inter turn short fault.
Keywords :
fault diagnosis; finite element analysis; machine theory; machine windings; permanent magnet motors; synchronous motors; FEM simulation; SRF; current distribution; deformed flux model; fault winding dynamics; fault winding flux information; finite elements method; forth order dynamics; inductance variation; interturn short fault model; negative sequence synchronous reference frame; parallel winding PMSM model; parallel winding connection; permanent magnet synchronous motors; phase winding distribution; positive sequence current assumption; positive sequence synchronous reference frame; series winding PMSM model; series winding connection; three phase winding dynamics; Circuit faults; Couplings; Equations; Integrated circuits; Magnetic flux; Mathematical model; Windings;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
Conference_Location :
Denver, CO
DOI :
10.1109/ECCE.2013.6647287