• DocumentCode
    1934525
  • Title

    Simulation of Gate-Controlled Double-Injection SOI Structures Application to Micromgnetodiode Sensors

  • Author

    Dimopoulos, G. ; Balestra, F. ; Chovet, A. ; Benachir, M. ; Brini, J.

  • Author_Institution
    Alexander Onassis Foundation Scholar, Laboratoire de Physique des Composants A Semiconducteurs (UA-CNRS 840), Institut National Polytechnique de Grenoble, ENSERG, 23 Avenue des Martyrs, 38031 GRENOBLE Cedex, FRANCE
  • fYear
    1987
  • fDate
    14-17 Sept. 1987
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    Among the sensors able to be integrated with VLSI technologies, the gated micromagnetodiode is one of the most attractive magnetic sensors due to its simple design, small size and good sensitivity. Micromagnetodiodes have been fabricated on Silicon-On-Insulator technology. Experimental results concerning magnetic sensitivity, current-voltage characteristics and transconductance are compared to simple models which allow to understand more easily the physical behaviour of gated double-injection devices.
  • Keywords
    Anodes; Current-voltage characteristics; Magnetic analysis; Magnetic devices; Magnetic films; Magnetic semiconductors; Magnetic sensors; Semiconductor films; Sensor phenomena and characterization; Silicon on insulator technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    0444704779
  • Type

    conf

  • Filename
    5436445