DocumentCode
1934540
Title
Lithography trends for sub-0.1μm technologies
Author
Guibert, Jean-Charles
Author_Institution
CEA, Centre d´´Etudes de Grenoble, France
Volume
2
fYear
2001
fDate
37165
Firstpage
439
Abstract
Lithography is the key enabling technology following the fast pace of feature size reduction, but also one of the major cost factors for the chip makers. Optical lithography is predicted to be applicable beyond 100 nm and 70 nm with the use of respectively 193 nm wavelength and 157 nm wavelength tools. Reduction of feature sizes to 50 nm and below will use NGL tools, and different candidate technology are present that will be discussed in this paper
Keywords
integrated circuit technology; lithography; 0.1 micron; integrated circuit technology; lithography; next generation technology; optical lithography; semiconductor manufacturing; Costs; Electron beams; Lithography; Manufacturing; Notice of Violation; Optical scattering; Optical sensors; Research and development; Throughput; Ultraviolet sources;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2001. CAS 2001 Proceedings. International
Conference_Location
Sinaia
Print_ISBN
0-7803-6666-2
Type
conf
DOI
10.1109/SMICND.2001.967502
Filename
967502
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