Title :
Lithography trends for sub-0.1μm technologies
Author :
Guibert, Jean-Charles
Author_Institution :
CEA, Centre d´´Etudes de Grenoble, France
Abstract :
Lithography is the key enabling technology following the fast pace of feature size reduction, but also one of the major cost factors for the chip makers. Optical lithography is predicted to be applicable beyond 100 nm and 70 nm with the use of respectively 193 nm wavelength and 157 nm wavelength tools. Reduction of feature sizes to 50 nm and below will use NGL tools, and different candidate technology are present that will be discussed in this paper
Keywords :
integrated circuit technology; lithography; 0.1 micron; integrated circuit technology; lithography; next generation technology; optical lithography; semiconductor manufacturing; Costs; Electron beams; Lithography; Manufacturing; Notice of Violation; Optical scattering; Optical sensors; Research and development; Throughput; Ultraviolet sources;
Conference_Titel :
Semiconductor Conference, 2001. CAS 2001 Proceedings. International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-6666-2
DOI :
10.1109/SMICND.2001.967502