• DocumentCode
    1934540
  • Title

    Lithography trends for sub-0.1μm technologies

  • Author

    Guibert, Jean-Charles

  • Author_Institution
    CEA, Centre d´´Etudes de Grenoble, France
  • Volume
    2
  • fYear
    2001
  • fDate
    37165
  • Firstpage
    439
  • Abstract
    Lithography is the key enabling technology following the fast pace of feature size reduction, but also one of the major cost factors for the chip makers. Optical lithography is predicted to be applicable beyond 100 nm and 70 nm with the use of respectively 193 nm wavelength and 157 nm wavelength tools. Reduction of feature sizes to 50 nm and below will use NGL tools, and different candidate technology are present that will be discussed in this paper
  • Keywords
    integrated circuit technology; lithography; 0.1 micron; integrated circuit technology; lithography; next generation technology; optical lithography; semiconductor manufacturing; Costs; Electron beams; Lithography; Manufacturing; Notice of Violation; Optical scattering; Optical sensors; Research and development; Throughput; Ultraviolet sources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2001. CAS 2001 Proceedings. International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-6666-2
  • Type

    conf

  • DOI
    10.1109/SMICND.2001.967502
  • Filename
    967502