• DocumentCode
    1934677
  • Title

    High-resolution spectroscopy as an X-ray laser plasma diagnostic

  • Author

    Koch, J.A. ; Batson, P.J. ; Da Silva, L.B. ; MacGowan, B.J. ; Matthews, D.L. ; Mrowka, S. ; Nilsen, J. ; Underwood, J.H.

  • Author_Institution
    Lawrence Livermore Nat. Lab., Livermore, CA, USA
  • fYear
    1993
  • fDate
    7-9 June 1993
  • Firstpage
    146
  • Abstract
    Summary form only given, as follows. A number of experiments have been performed using a high-resolution XUV (extreme ultraviolet) spectrometer to measure the spectral widths of X-ray laser lines from several elements. These experiments used yttrium, selenium, niobium, and zirconium targets, and included an investigation of the effects of gain and saturation on X-ray laser line widths and the measurement of hyperfine splitting effects on X-ray laser line shapes. The relevance of the data obtained to the understanding of the physics of X-ray laser plasmas and high-temperature laser-produced plasmas in general has been examined.
  • Keywords
    X-ray lasers; Nb; Se; X-ray laser lines; X-ray laser plasma diagnostic; XUV spectroscopy; Y; Zr; gain; high-resolution spectroscopy; high-temperature laser-produced plasmas; hyperfine splitting effects; laser line shapes; saturation; spectral widths; Laser theory; Performance evaluation; Plasma diagnostics; Plasma measurements; Plasma x-ray sources; Shape measurement; Spectroscopy; Ultraviolet sources; X-ray lasers; Yttrium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
  • Conference_Location
    Vancouver, BC, Canada
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-1360-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.1993.593419
  • Filename
    593419