• DocumentCode
    1934836
  • Title

    Dual-stage microinverter design with a GaN-based interleaved flyback converter stage

  • Author

    Garcia-Rodriguez, L. ; Williams, Evan ; Balda, Juan Carlos ; Gonzalez-Llorente, J. ; Lindstrom, E. ; Oliva, Alfonso

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Arkansas, Fayetteville, AR, USA
  • fYear
    2013
  • fDate
    15-19 Sept. 2013
  • Firstpage
    4496
  • Lastpage
    4502
  • Abstract
    Photovoltaic (PV) systems must maximize the energy harvested from the PV panel. One method is the use of microinverters that are less susceptible to shade effects when compared to string or central inverters. Efficiency is always an important specification, particularly, when compared to that of a central inverter. The main losses of a microinverter are transformer and semiconductor losses. Power switching devices based on silicon (Si) material are traditionally used, and silicon carbide (SiC) Schottky diodes are replacing Si diodes due to their low reverse recovery energy. Recently, Gallium Nitride (GaN) power switching devices, capable of switching at higher frequencies with fewer losses when compared to Si or SiC devices, have been introduced. Higher frequencies enable designs with smaller capacitive and inductive elements. This in turn reduces system size and cost. This work analyzes a dual-stage microinverter with an interleaved flyback converter in the dc-dc stage and GaN devices for the low-voltage side. Experimental results from a 40W prototype confirm the benefits of the proposed system.
  • Keywords
    DC-DC power convertors; III-V semiconductors; gallium compounds; invertors; power semiconductor switches; wide band gap semiconductors; DC-DC converter; GaN; PV panel; PV system; capacitive elements; dual-stage microinverter design; energy harvesting; inductive elements; interleaved flyback converter stage; low reverse recovery energy; photovoltaic systems; power 40 W; power switching devices; semiconductor losses; silicon carbide Schottky diodes; silicon material; transformer losses; Capacitance; Gallium nitride; Logic gates; Silicon; Silicon carbide; Switching frequency; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/ECCE.2013.6647302
  • Filename
    6647302