Title :
Materials Performance At Frequencies Up To 20 Ghz
Author :
Amey, D.I. ; Horowitz, Samuel J.
Keywords :
Ceramics; Circuit testing; Conducting materials; Conductive films; Dielectric constant; Dielectric materials; Dielectric substrates; Frequency; Materials testing; Thick films;
Conference_Titel :
IEMT/IMC Symposium, 1997., 1st [Joint International Electronic Manufacturing Symposium and the International Microelectronics Conference]
Conference_Location :
IEEE
Print_ISBN :
0-7803-4235-6
