Title :
Fast 5 ns pulse width measurement in a high-speed signal integrity test system
Author :
Nastase, Adrian S. ; Nelson, Ronald L.
Author_Institution :
Newport Corp., Irvine, CA, USA
Abstract :
This paper presents a measurement method that can evaluate the pulse width and shape, as low as 5 ns, in high speed signals. It is very useful in signal integrity test systems, where the test speed and accuracy are at premium. This method is an elegant alternative to the DSP techniques
Keywords :
high-speed techniques; pulse analysers; pulse measurement; test equipment; 5 ns; DSP techniques; high speed signals; high-speed signal integrity test system; measurement method; pulse shape; pulse width; pulse width measurement; signal integrity test systems; test accuracy; test speed; Circuit testing; Degradation; Digital signal processing; Lakes; Pulse measurements; Pulse shaping methods; Shape measurement; Space vector pulse width modulation; System testing; Velocity measurement;
Conference_Titel :
Semiconductor Conference, 2001. CAS 2001 Proceedings. International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-6666-2
DOI :
10.1109/SMICND.2001.967521
