DocumentCode
1935247
Title
Microporous silicon for CMOS compatible MST
Author
Valera, E. ; Duch, M. ; Rodríguez, A. ; Esteve, J.
Author_Institution
Departament d´´Enginyeria Electronica, Univ. Politecnica de Catalunya, Barcelona, Spain
fYear
2005
fDate
2-4 Feb. 2005
Firstpage
481
Lastpage
483
Abstract
The use of selectively formed microporous silicon as a sacrificial layer in silicon micromachining has been studied. Porous silicon formation, by isotropic etching in hydrofluoric acid (HF) can be selective, by creating n-type areas on a p-type substrate, or also, using polycrystalline silicon under adequate conditions. Porous silicon can be removed easily by CMOS compatible chemicals. Using this technology, free standing membranes, cantilevers, bridges and microchannels, can be fabricated. Porous silicon etching is much easier and faster than crystalline silicon isotropic etching, and both fabrication and etching of the porous film can be performed at, or nearly at room temperature. Thick layers of porous silicon can be easily produced. The formation conditions of the microporous silicon layer and the etch conditions for microstructures fabrication are described.
Keywords
CMOS integrated circuits; crystal microstructure; etching; masks; micromachining; porous materials; silicon; CMOS compatible MST; CMOS compatible chemicals; HF; bridges; cantilevers; free standing membranes; hydrofluoric acid; isotropic etching; microchannels; microporous silicon layer; microstructure fabrication; n-type area; p-type substrate; polycrystalline silicon; porous film; porous silicon; sacrificial layer; silicon micromachining; Biomembranes; Bridges; CMOS technology; Chemical technology; Etching; Fabrication; Hafnium; Micromachining; Silicon; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices, 2005 Spanish Conference on
Conference_Location
Tarragona
Print_ISBN
0-7803-8810-0
Type
conf
DOI
10.1109/SCED.2005.1504489
Filename
1504489
Link To Document