• DocumentCode
    1935247
  • Title

    Microporous silicon for CMOS compatible MST

  • Author

    Valera, E. ; Duch, M. ; Rodríguez, A. ; Esteve, J.

  • Author_Institution
    Departament d´´Enginyeria Electronica, Univ. Politecnica de Catalunya, Barcelona, Spain
  • fYear
    2005
  • fDate
    2-4 Feb. 2005
  • Firstpage
    481
  • Lastpage
    483
  • Abstract
    The use of selectively formed microporous silicon as a sacrificial layer in silicon micromachining has been studied. Porous silicon formation, by isotropic etching in hydrofluoric acid (HF) can be selective, by creating n-type areas on a p-type substrate, or also, using polycrystalline silicon under adequate conditions. Porous silicon can be removed easily by CMOS compatible chemicals. Using this technology, free standing membranes, cantilevers, bridges and microchannels, can be fabricated. Porous silicon etching is much easier and faster than crystalline silicon isotropic etching, and both fabrication and etching of the porous film can be performed at, or nearly at room temperature. Thick layers of porous silicon can be easily produced. The formation conditions of the microporous silicon layer and the etch conditions for microstructures fabrication are described.
  • Keywords
    CMOS integrated circuits; crystal microstructure; etching; masks; micromachining; porous materials; silicon; CMOS compatible MST; CMOS compatible chemicals; HF; bridges; cantilevers; free standing membranes; hydrofluoric acid; isotropic etching; microchannels; microporous silicon layer; microstructure fabrication; n-type area; p-type substrate; polycrystalline silicon; porous film; porous silicon; sacrificial layer; silicon micromachining; Biomembranes; Bridges; CMOS technology; Chemical technology; Etching; Fabrication; Hafnium; Micromachining; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2005 Spanish Conference on
  • Conference_Location
    Tarragona
  • Print_ISBN
    0-7803-8810-0
  • Type

    conf

  • DOI
    10.1109/SCED.2005.1504489
  • Filename
    1504489