Title :
Performance Drift Mechanisms of 1.3 μm Lasers During Aging
Author :
Changenet, A. ; Mottet, S. ; Carriere, C. ; Vetu, E.
Author_Institution :
Centre National d´´Etudes des Télécommunications., 3, avenue de la République 92131 ISSY les MOULINEAUX FRANCE
Abstract :
To understand the aging mechanisms of lasers, we have developed a semi analytical electrical model giving access to the physical parameters of the quaternary active layer of 1.3 μm laser diodes. Coupled with the simulation of the leakage paths, this model is used to analyse the aging behaviour of a particular 1,3 μm B.H. laser diode´s structure.
Keywords :
Aging; Analytical models; Contact resistance; Current-voltage characteristics; Diode lasers; Laser modes; Leakage current; Thermal degradation; Thermal stresses; Threshold current;
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany
