• DocumentCode
    1935265
  • Title

    Performance Drift Mechanisms of 1.3 μm Lasers During Aging

  • Author

    Changenet, A. ; Mottet, S. ; Carriere, C. ; Vetu, E.

  • Author_Institution
    Centre National d´´Etudes des Télécommunications., 3, avenue de la République 92131 ISSY les MOULINEAUX FRANCE
  • fYear
    1989
  • fDate
    11-14 Sept. 1989
  • Firstpage
    833
  • Lastpage
    836
  • Abstract
    To understand the aging mechanisms of lasers, we have developed a semi analytical electrical model giving access to the physical parameters of the quaternary active layer of 1.3 μm laser diodes. Coupled with the simulation of the leakage paths, this model is used to analyse the aging behaviour of a particular 1,3 μm B.H. laser diode´s structure.
  • Keywords
    Aging; Analytical models; Contact resistance; Current-voltage characteristics; Diode lasers; Laser modes; Leakage current; Thermal degradation; Thermal stresses; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
  • Conference_Location
    Berlin, Germany
  • Print_ISBN
    0387510001
  • Type

    conf

  • Filename
    5436470
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1935265