• DocumentCode
    1935409
  • Title

    Modelling of the Drain Lag Effect in GaAs MESFET´s and its Impact on Digital IC´s

  • Author

    Ducourant, Thierry ; Rocchi, Marc

  • Author_Institution
    LEP: Laboratoires d´´Electronique et de Physique Appliqée, Membre de l´´Organisation de Recherche Internationale de Philips, 3, avenue Descartes, 94451 LIMEIL-BREVANNES CEDEX, France
  • fYear
    1987
  • fDate
    14-17 Sept. 1987
  • Firstpage
    313
  • Lastpage
    316
  • Keywords
    Application specific integrated circuits; Degradation; Digital integrated circuits; Electrons; Frequency dependence; Frequency measurement; Gallium arsenide; Integrated circuit modeling; MESFET integrated circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    0444704779
  • Type

    conf

  • Filename
    5436478
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1935409