• DocumentCode
    1935635
  • Title

    Predicting and controlling FPGA Device Heat using System monitor and IBERT (internal bit error ratio tester)

  • Author

    Ibala, Christian Serge ; Arshak, Khalil

  • Author_Institution
    PAE Logic Drive, XILINX, Dublin, Ireland
  • fYear
    2009
  • fDate
    25-27 June 2009
  • Firstpage
    370
  • Lastpage
    374
  • Abstract
    The aim of this paper is to present a new methodology and the tools used to predict and control the FPGA Device Heat before starting the design. Knowing that the FPGA silicon heat is crucial as they all have a temperature above and under which their functionalities is not longer guaranteed. The silicon temperature is linked to the different options and strategies used to implement the design. Many tools such ldquouse Xpowerrdquo from Xilinx allows the user to have an estimation of the power consumption. This paper will present a primitive called System monitor which is present in every Virtex 5 to monitor the environment around the FPGA. Monitoring the device environment maximises the probability of getting the FPGA work after implementing required design.
  • Keywords
    error statistics; field programmable gate arrays; monitoring; testing; FPGA; IBERT; Virtex 5; device heat; internal bit error ratio tester; system monitor; Circuit testing; Control systems; Error correction; Field programmable gate arrays; Logic design; Monitoring; System testing; Temperature control; Temperature sensors; Voltage; FPGA; Heat; IBERT; Prediction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits & Systems, 2009. MIXDES '09. MIXDES-16th International Conference
  • Conference_Location
    Lodz
  • Print_ISBN
    978-1-4244-4798-5
  • Electronic_ISBN
    978-83-928756-1-1
  • Type

    conf

  • Filename
    5289585