DocumentCode
1935635
Title
Predicting and controlling FPGA Device Heat using System monitor and IBERT (internal bit error ratio tester)
Author
Ibala, Christian Serge ; Arshak, Khalil
Author_Institution
PAE Logic Drive, XILINX, Dublin, Ireland
fYear
2009
fDate
25-27 June 2009
Firstpage
370
Lastpage
374
Abstract
The aim of this paper is to present a new methodology and the tools used to predict and control the FPGA Device Heat before starting the design. Knowing that the FPGA silicon heat is crucial as they all have a temperature above and under which their functionalities is not longer guaranteed. The silicon temperature is linked to the different options and strategies used to implement the design. Many tools such ldquouse Xpowerrdquo from Xilinx allows the user to have an estimation of the power consumption. This paper will present a primitive called System monitor which is present in every Virtex 5 to monitor the environment around the FPGA. Monitoring the device environment maximises the probability of getting the FPGA work after implementing required design.
Keywords
error statistics; field programmable gate arrays; monitoring; testing; FPGA; IBERT; Virtex 5; device heat; internal bit error ratio tester; system monitor; Circuit testing; Control systems; Error correction; Field programmable gate arrays; Logic design; Monitoring; System testing; Temperature control; Temperature sensors; Voltage; FPGA; Heat; IBERT; Prediction;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed Design of Integrated Circuits & Systems, 2009. MIXDES '09. MIXDES-16th International Conference
Conference_Location
Lodz
Print_ISBN
978-1-4244-4798-5
Electronic_ISBN
978-83-928756-1-1
Type
conf
Filename
5289585
Link To Document