DocumentCode :
1935635
Title :
Predicting and controlling FPGA Device Heat using System monitor and IBERT (internal bit error ratio tester)
Author :
Ibala, Christian Serge ; Arshak, Khalil
Author_Institution :
PAE Logic Drive, XILINX, Dublin, Ireland
fYear :
2009
fDate :
25-27 June 2009
Firstpage :
370
Lastpage :
374
Abstract :
The aim of this paper is to present a new methodology and the tools used to predict and control the FPGA Device Heat before starting the design. Knowing that the FPGA silicon heat is crucial as they all have a temperature above and under which their functionalities is not longer guaranteed. The silicon temperature is linked to the different options and strategies used to implement the design. Many tools such ldquouse Xpowerrdquo from Xilinx allows the user to have an estimation of the power consumption. This paper will present a primitive called System monitor which is present in every Virtex 5 to monitor the environment around the FPGA. Monitoring the device environment maximises the probability of getting the FPGA work after implementing required design.
Keywords :
error statistics; field programmable gate arrays; monitoring; testing; FPGA; IBERT; Virtex 5; device heat; internal bit error ratio tester; system monitor; Circuit testing; Control systems; Error correction; Field programmable gate arrays; Logic design; Monitoring; System testing; Temperature control; Temperature sensors; Voltage; FPGA; Heat; IBERT; Prediction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed Design of Integrated Circuits & Systems, 2009. MIXDES '09. MIXDES-16th International Conference
Conference_Location :
Lodz
Print_ISBN :
978-1-4244-4798-5
Electronic_ISBN :
978-83-928756-1-1
Type :
conf
Filename :
5289585
Link To Document :
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