Title :
Hamming count-a compaction testing technique
Author :
Gleason, Anita ; Jone, Wen-Ben
Author_Institution :
Dept. of Comput. Sci., New Mexico Polytech., Socorro, NM, USA
Abstract :
A signature compaction method called Hamming count (H-count) is introduced. H-count is similar to a reduced Walsh spectral coefficient test, and encompasses all syndrome testable faults. H-count has both a lower masking probability and a simpler circuit design than the index vector test. The method provides an efficient and effective compaction technique
Keywords :
VLSI; integrated circuit testing; logic testing; BIST method; H-count; Hamming count; compaction testing technique; index vector test; lower masking probability; reduced Walsh spectral coefficient test; signature compaction method; simpler circuit design; syndrome testable faults; Automatic test equipment; Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Compaction; Computer science; Counting circuits; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1989. ICCD '89. Proceedings., 1989 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-1971-6
DOI :
10.1109/ICCD.1989.63384
