Hamming count-a compaction testing technique

Author

Gleason, Anita ; Jone, Wen-Ben

Author_Institution

Dept. of Comput. Sci., New Mexico Polytech., Socorro, NM, USA

fYear

1989

fDate

2-4 Oct 1989

Firstpage

344

Lastpage

347

Abstract

A signature compaction method called Hamming count (H-count) is introduced. H-count is similar to a reduced Walsh spectral coefficient test, and encompasses all syndrome testable faults. H-count has both a lower masking probability and a simpler circuit design than the index vector test. The method provides an efficient and effective compaction technique

Keywords

VLSI; integrated circuit testing; logic testing; BIST method; H-count; Hamming count; compaction testing technique; index vector test; lower masking probability; reduced Walsh spectral coefficient test; signature compaction method; simpler circuit design; syndrome testable faults; Automatic test equipment; Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Compaction; Computer science; Counting circuits; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design: VLSI in Computers and Processors, 1989. ICCD '89. Proceedings., 1989 IEEE International Conference on

Conference_Location

Cambridge, MA

Print_ISBN

0-8186-1971-6

Type

conf

DOI

10.1109/ICCD.1989.63384

Filename

63384

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1935643