DocumentCode :
1935763
Title :
Electronic nose for the identification of spoiled Iberian hams
Author :
García, M. ; Aleixandre, M. ; Horrillo, M.C.
Author_Institution :
Lab. de Sensores, IFA-CSIC, Madrid, Spain
fYear :
2005
fDate :
2-4 Feb. 2005
Firstpage :
537
Lastpage :
540
Abstract :
This paper reports the use of an electronic nose for the identification of spoiled hams during the curing process. The sensors involved are tin oxide semiconductor thin films. They were prepared by RF sputtering. Some of the sensors were doped with metal catalysts as Cr and In. A good discrimination of two types of Iberian hams (spoiled and unspoilt) has been obtained through the statistical methods of principal component analysis (PCA) and probabilistic neural network (PNN).
Keywords :
chemical sensors; chromium; electronic noses; indium; neural nets; principal component analysis; semiconductor doping; sputtering; tin compounds; Cr; In; RF sputtering; SnO/sub 2/; curing process; electronic nose; metal catalysts; principal component analysis; probabilistic neural network; sensors; spoiled Iberian hams; tin oxide semiconductor thin films; Chromium; Curing; Electronic noses; Principal component analysis; Radio frequency; Radiofrequency identification; Semiconductor thin films; Sputtering; Thin film sensors; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices, 2005 Spanish Conference on
Conference_Location :
Tarragona
Print_ISBN :
0-7803-8810-0
Type :
conf
DOI :
10.1109/SCED.2005.1504508
Filename :
1504508
Link To Document :
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