• DocumentCode
    1935811
  • Title

    Paradigm shift in proper selection criteria of VFD cable for variable frequency drives

  • Author

    Shah, Alpa

  • Author_Institution
    Strategic Marketing and Sales, Service Wire Co., USA
  • fYear
    2011
  • fDate
    22-26 May 2011
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    Power cable between the inverter and motor is a key component in the drive-motor assembly and is regularly overlooked. This paper describes a new solution for cables used with Insulated Gate Bipolar Transistor (IGBT) Variable Frequency Drives (VFD´s). A new cable solution that includes the use of new connector & termination kit that will produce an overall better result and superior performance of the VFD installation. The complete cable system consists of cables specifically designed to build in all the optimum components along with matching connectors. The connectors provide a 360° contact and maintain a continuous low impedance path on the cable´s shield from the motor to the drive or drive cabinet to avoid leakage of stray currents. This prevents shaft and bearing currents in the motor and gearbox. VFD systems present a different set of requirements for cable components, and this article focuses on how wire and cable fit into reliability and sustainability of a process that can impact the bottom line of any operation.
  • Keywords
    electric connectors; insulated gate bipolar transistors; leakage currents; machine bearings; power cables; variable speed drives; VFD cable; VFD installation; bearing current; conduit; continuously welded aluminum armored cable; drive-motor assembly; electronic failure; high frequency noise; impedance path; insulated gate bipolar transistor drive; plant ground system; power cable; shaft current; stray current; switching speed; variable frequency drive; Cable insulation; Cable shielding; Corona; Impedance; Noise; Power cables;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cement Industry Technical Conference, 2011 IEEE-IAS/PCA 53rd
  • Conference_Location
    St. Louis, MO
  • ISSN
    2155-9139
  • Print_ISBN
    978-1-4244-9466-8
  • Type

    conf

  • DOI
    10.1109/CITCON.2011.5934545
  • Filename
    5934545