Title :
Anomalous Punchthrough in ULSI Buried-channel P-MOSFETs
Author :
Skotnicki, Tomasz ; Merckel, Gérard ; Pedron, Thierry
Author_Institution :
Centre National d´´Etude des Télécommunications (CNET-CNS), B.P. 98, Chemin du Vieux Chene 38243 Meylan, FRANCE
Keywords :
CMOS process; Doping; Implants; MOSFET circuits; Numerical simulation; Power MOSFET; Power dissipation; Tellurium; Ultra large scale integration; Voltage;
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany