Title :
Invited Speech: BigData application for 28nm and below
Abstract :
BigData application has been explored in semiconductor industry. However, there are very few success stories so far. In this presentation, we will highlight the main challenges for BigData application for 28nm below, from data collection, analysis software and algorithm, and ROI point of view. We will then describe our concept of YieldAware - BigRealData (YA-Bird) concept. Finally, we will show some examples of BigData application for parametric yield improvement for 28nm and below.
Keywords :
data analysis; production engineering computing; production management; semiconductor industry; BigData application; ROI point-of-view; YieldAware-BigRealData concept; analysis software; data collection; parametric yield improvement; return-on-investment; semiconductor industry; size 28 nm; Abstracts; Collaboration; Companies; Educational institutions; Europe; Speech;
Conference_Titel :
e-Manufacturing & Design Collaboration Symposium (eMDC), 2012
Conference_Location :
HsinChu
Print_ISBN :
978-1-4673-4540-8
DOI :
10.1109/eMDC.2012.6338431
