• DocumentCode
    1936555
  • Title

    Micro bridge technology, a better solution for 3D-IC interconnection

  • Author

    Cheng, K.

  • Author_Institution
    Innotest Inc., Hsinchu, Taiwan
  • fYear
    2012
  • fDate
    4-4 Sept. 2012
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. We all know that the cloud computing era is becoming more reality now-a-days. To handle the data information down loaded from the cloud computing we need a smart terminal to manipulate these down loaded data to meet your local need either private or business sectors. The 3D-Computer based on the 3D-IC design architecture maybe the best choice for this purpose. This 3D-Computer will not only meet the challenge of cloud computing but also meet the global warming regulation pertaining to the less carbon consumption and energy saving criterion. The main technologies for integration and manufacturing the 3D-Computer are (1) through silicon via (TSV) technology for vertical communication; (2) interconnecting technology to accomplish the up and down signal message transferable between wafer layers and (3) stacking technology to complete the final assembly of the 3D-Computer system. There is one thing very important in the integration and manufacturing process which is the testing and evaluating of the 3D-IC stacked system. This paper will dedicate to the issue of choosing the right interconnecting technology for cost effective consideration by introducing the micro bridge technology. With the right choice of interconnecting technology will benefit to the reduction of the 3D-IC and 3D-Computer testing both in cost and complexity.
  • Keywords
    cloud computing; energy conservation; integrated circuit design; integrated circuit manufacture; production engineering computing; 3D-Computer testing; 3D-IC design architecture; 3D-IC interconnection; 3D-IC stacked system; 3D-IC testing; TSV technology; carbon consumption; cloud computing; data information; energy saving criterion; global warming regulation; microbridge technology; smart terminal; through silicon via technology; Abstracts; Bridges; Cloud computing; Electronic mail; Mobile communication; Roads; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    e-Manufacturing & Design Collaboration Symposium (eMDC), 2012
  • Conference_Location
    HsinChu
  • Print_ISBN
    978-1-4673-4540-8
  • Type

    conf

  • DOI
    10.1109/eMDC.2012.6338438
  • Filename
    6338438