• DocumentCode
    1936618
  • Title

    Dependence on Gate Length of Electrical Properties of Self-aligned AlGaAs/GaAs HEMTs Studied by Monte Carlo Technique

  • Author

    Jensen, G.U. ; Lund, B. ; Fjeldly, T.A. ; Shur, M.S.

  • Author_Institution
    Department of Electrical Engineering and Computer Science, Norwegian Institute of Technology, University of Trondheim, N-7034, Trondheim, Norway.
  • fYear
    1989
  • fDate
    11-14 Sept. 1989
  • Firstpage
    615
  • Lastpage
    618
  • Abstract
    Various electrical properties of self-aligned AlGaAs/GaAs heterostructure field¿effect transistors (HEMTs) have been studied by self-consistent ensemble Monte Carlo simulations for gatelengths between 0.1 and 1.0 ¿m, and for different depths of ohmic contacts. The maximum transconductance is found to be only weakly dependent on gate length and contact depth. The output drain conductance and the threshold voltage show pronounced short-channel effects for gate lengths at or below 0.2 ¿m and shallow contacts. With deeper contacts, the short¿channel effects appear at longer gate lengths. The switching times vary with gate length from 1.0 ps at 0.1 ¿m to 5.0 ps at 1.0 ¿m. The observed effects are discussed in terms of simple models.
  • Keywords
    Computer simulation; Doping; Electrodes; Gallium arsenide; HEMTs; MODFETs; Microwave technology; Monte Carlo methods; Solid modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
  • Conference_Location
    Berlin, Germany
  • Print_ISBN
    0387510001
  • Type

    conf

  • Filename
    5436527