DocumentCode
1936618
Title
Dependence on Gate Length of Electrical Properties of Self-aligned AlGaAs/GaAs HEMTs Studied by Monte Carlo Technique
Author
Jensen, G.U. ; Lund, B. ; Fjeldly, T.A. ; Shur, M.S.
Author_Institution
Department of Electrical Engineering and Computer Science, Norwegian Institute of Technology, University of Trondheim, N-7034, Trondheim, Norway.
fYear
1989
fDate
11-14 Sept. 1989
Firstpage
615
Lastpage
618
Abstract
Various electrical properties of self-aligned AlGaAs/GaAs heterostructure field¿effect transistors (HEMTs) have been studied by self-consistent ensemble Monte Carlo simulations for gatelengths between 0.1 and 1.0 ¿m, and for different depths of ohmic contacts. The maximum transconductance is found to be only weakly dependent on gate length and contact depth. The output drain conductance and the threshold voltage show pronounced short-channel effects for gate lengths at or below 0.2 ¿m and shallow contacts. With deeper contacts, the short¿channel effects appear at longer gate lengths. The switching times vary with gate length from 1.0 ps at 0.1 ¿m to 5.0 ps at 1.0 ¿m. The observed effects are discussed in terms of simple models.
Keywords
Computer simulation; Doping; Electrodes; Gallium arsenide; HEMTs; MODFETs; Microwave technology; Monte Carlo methods; Solid modeling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location
Berlin, Germany
Print_ISBN
0387510001
Type
conf
Filename
5436527
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