DocumentCode :
1936700
Title :
Composition and process dependence of sputtered NiFe thin films
Author :
Byun, Chongwon ; Xiong, Wei
Author_Institution :
MKE Quantum Components
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Atomic measurements; Iron; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetostriction; Perpendicular magnetic anisotropy; Rough surfaces; Sputtering; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
Type :
conf
DOI :
10.1109/INTMAG.1999.837956
Filename :
837956
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1936700
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