Title :
Effects of decreasing extent of electromagnetic field at LSI mounting area on radiated emission from PCB
Author :
Haga, Satoru ; Nakano, Ken ; Sudo, Toshio
Author_Institution :
Assoc. of Super-Advanced Electron. Technol., Tsukuba Center Inc., Ibaraki, Japan
Abstract :
Radiating mechanism and reduction measures have been studied using test LSI and PCB. Among LSI operation modes, I/O buffer operation radiates the greatest amount of emission and shows that LSI mounting area behaves an opening from the electromagnetic viewpoint. The measure, decreasing extent of electromagnetic field at LSI mounting area, have been verified effective
Keywords :
electromagnetic fields; large scale integration; printed circuits; I/O buffer operation; LSI mounting area; PCB; electromagnetic field; radiated emission; Area measurement; Capacitors; Circuit testing; Copper; Electromagnetic fields; Electromagnetic measurements; Electronic equipment testing; Large scale integration; Magnetic field measurement; Packaging;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2001
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-7024-4
DOI :
10.1109/EPEP.2001.967603
