DocumentCode :
1937105
Title :
A Model for Oxygen Phase Transition Kinetics in CZ Grown Silicon and its Applications to IC Processes
Author :
Pagani, M. ; Huber, W.
Author_Institution :
Dynamit Nobel Silicon SpA, 28100 Novara, Italy
fYear :
1987
fDate :
14-17 Sept. 1987
Firstpage :
339
Lastpage :
342
Abstract :
A model for oxygen precipitation in silicon at high temperatures has been developed and tested succesfully on different low-high treatment. The model was then extended to multistep treatments and tested on CMOS/NMOS processes simulations; trends are correctly predicted.
Keywords :
Application specific integrated circuits; CMOS process; Integrated circuit modeling; Kinetic theory; Oxygen; Predictive models; Semiconductor device modeling; Silicon; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
Print_ISBN :
0444704779
Type :
conf
Filename :
5436550
Link To Document :
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