Title :
Characterization of on-chip capacitance effects for I/O circuits and core circuits
Author :
Sudo, Toshio ; Nakano, Ken ; Kudo, Junichi ; Haga, Satoru
Author_Institution :
Assoc. of Super-Advanced Electron. Technol., Tsukuba, Japan
Abstract :
This paper presents experimental results for two types of CMOS VLSI test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits
Keywords :
CMOS integrated circuits; VLSI; capacitance; electromagnetic compatibility; electromagnetic interference; integrated circuit noise; integrated circuit packaging; integrated circuit testing; integrated logic circuits; CMOS VLSIs; I/O circuits; SSN; core circuits; core logic circuits; electromagnetic radiation; on-chip capacitance; on-chip capacitance effects; radiated emission; simultaneous switching; simultaneous switching noise; test chips; CMOS technology; Capacitance; Circuit noise; Circuit testing; Driver circuits; Electromagnetic interference; Electromagnetic radiation; Electronics packaging; Logic circuits; Semiconductor device measurement;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2001
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-7024-4
DOI :
10.1109/EPEP.2001.967614
