Title :
Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements
Author :
Kim, Woopoung ; Lee, Seock Hee ; Swaminathan, Madhavan ; Tummala, Rao R.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper discusses a method for extracting the frequency dependent characteristic impedance of transmission lines from Time Domain Reflectometry (TDR) measurements using an Open, Short, Load, and Shortline calibration. The frequency dependent behavior of transmission lines was successfully captured using this method. Two types of transmission lines were measured using this method namely, thick metal transmission lines in Printed Wiring Board (PWB) and thin transmission lines in MCM-L technology
Keywords :
calibration; electric impedance measurement; high-frequency transmission line measurement; multichip modules; printed circuits; time-domain reflectometry; MCM-L technology; calibration; frequency-dependent characteristic impedance; one-port measurement; parameter extraction; printed wiring board; time domain reflectometry; transmission line; Calibration; Frequency dependence; Frequency measurement; Impedance measurement; Reflectometry; Robustness; Thickness measurement; Time measurement; Transmission line measurements; Wiring;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2001
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-7024-4
DOI :
10.1109/EPEP.2001.967624
