DocumentCode :
1937497
Title :
Analysis of single-trial EEG data using a combined robust pre-whitening technique and ICA approach
Author :
Zhao, Liungyu ; Cao, Jianting ; Hoya, Tetsuya ; Cichocki, Andrzej
Author_Institution :
Graduate Sch. of Eng., Saitama Inst. of Technol., Japan
fYear :
2005
fDate :
28-30 May 2005
Firstpage :
238
Lastpage :
242
Abstract :
In electroencephalograph (EEG) experiment, the measure result are usually influenced by different kinds of noise with high power. Treating an averaged event-related potential (ERP) data is a main approach in recent topics of applying independent component analysis (ICA) to EEG signal processing. By taking the average, the signal-noise ratio (SNR) is increased, however, some important information such as the trial-by-trial variation of the amplitude is lost during the averaging. On the other hand, the analysis of single-trial data is generally hard in the low SNR. This paper presents a robust pre-whitening technique with ICA approach for the unaveraged single-trial EEG data. Our approach is based upon the two techniques: decorrelation with a high-level additive noise reduction and decomposition of individual source components. The results on the unaveraged visual evoked potential (VEP) single-trial data analysis illustrate that not only the behavior and location but also the activity strength (amplitude) and dynamics of the individual evoked response can be visualized by the proposed method.
Keywords :
AWGN; decorrelation; electroencephalography; independent component analysis; medical signal processing; signal denoising; ICA approach; additive noise decomposition; additive noise reduction; electroencephalograph; event-related potential data; independent component analysis; pre-whitening technique; signal decorrelation; signal-noise ratio; single-trial EEG data; visual evoked potential; Data analysis; Decorrelation; Electroencephalography; Enterprise resource planning; Independent component analysis; Noise measurement; Noise robustness; Power measurement; Signal processing; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design and Video Technology, 2005. Proceedings of 2005 IEEE International Workshop on
Print_ISBN :
0-7803-9005-9
Type :
conf
DOI :
10.1109/IWVDVT.2005.1504595
Filename :
1504595
Link To Document :
بازگشت