DocumentCode :
1937578
Title :
The pretreatment of aluminum bondpads for electroless nickel bumping
Author :
Ostmann, A. ; Simon, J. ; Reichl, H.
Author_Institution :
Tech. Univ. Berlin, Germany
fYear :
1993
fDate :
15-18 Mar 1993
Firstpage :
74
Lastpage :
78
Abstract :
Electroless nickel bumping is a low cost approach to bumping. This method can also be used to convert the aluminum bondpad to a solderable surface (Ni/Au) for flip-chip application. In this study, Ni/P-bumps were produced by electroless nickel plating on different samples. For the pretreatment of aluminum bondpads, a commercial zincate solution was modified. The shear strength and the electrical resistance were investigated for different initial states of aluminum bondpads. It is shown that residues on the aluminum from the semiconductor fabrication can cause an increase in the electrical resistance and a decrease in shear strength. On clean aluminum bondpads, bumps with a shear strength of 180 cN and an electrical resistance below 1 mΩ have been achieved. Thermal cycling shows no significant decrease in the shear strength
Keywords :
aluminium; electroless deposition; flip-chip devices; microassembling; multichip modules; nickel; shear strength; surface treatment; Al bondpads pretreatment; MCM; Ni; Ni-Au surface; NiP; annealing; electrical resistance; electroless bumping process; electroless plating; flip-chip application; semiconductor fabrication; shear strength; thermal cycling; Aluminum; Bonding; Copper; Costs; Electric resistance; Gold; Nickel; Substrates; Surface cleaning; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multi-Chip Module Conference, 1993. MCMC-93, Proceedings., 1993 IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-3540-1
Type :
conf
DOI :
10.1109/MCMC.1993.302148
Filename :
302148
Link To Document :
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