Title :
Polymeric multi/demultiplexers using light-induced self-written waveguides for cost-effective optical interconnection
Author :
Yamashita, Tatsuya ; Kawasaki, Akari ; Kagami, Manabu ; Yasuda, Takashi ; Goto, Hideki
Author_Institution :
Toyota Central R&D Labs., Inc., Nagakute, Japan
Abstract :
Light-induced self-written (LISW) waveguides provide us with a simple method of forming low-loss 3-dimensional optical waveguide components in photopolymers using irradiation from optical fibers. Using simultaneous irradiation from optical fibers fixed to three I/O sockets, onto which VCSELs (vertical surface emitting laser) and PDs (photo diode) can be mounted, we successfully fabricated a polymeric multi/demultiplexer, consisting of a WDM filter and a branching waveguide suitable for a PCS (polymer cladding silica) fiber. A 1 Gbit/s bidirectional full-duplex WDM transceiver module with dual wavelength multimode VCSELs (780 nm and 850 nm) was demonstrated. The typical insertion losses of the module were 4.1 dB for the 780 nm VCSEL and 3.4 dB for the 850 nm VCSEL at room temperature. The receiver sensitivities were -11.8 dBm and -13.6 dBm at 850 nm and 780 nm, respectively.
Keywords :
demultiplexing equipment; optical interconnections; optical polymers; optical transceivers; optical waveguides; photodiodes; surface emitting lasers; wavelength division multiplexing; I/O sockets; LISW waveguides; VCSEL; WDM filter; bidirectional full-duplex WDM transceiver module; bit rate 1 Gbit/s; branching waveguide; cost-effective optical interconnection; dual wavelength multimode VCSEL; insertion losses; light-induced self-written waveguides; low-loss 3-dimensional optical waveguide components; optical fibers; photodiode; photopolymers; polymer cladding silica fiber; polymeric multi/demultiplexers; temperature 293 K to 298 K; vertical surface emitting laser; wavelength 780 nm; wavelength 850 nm; Optical device fabrication; Optical fiber communication; Optical fibers; Optical polymers; Wavelength division multiplexing;
Conference_Titel :
CPMT Symposium Japan, 2010 IEEE
Conference_Location :
Tokyo
Print_ISBN :
978-1-4244-7593-3
DOI :
10.1109/CPMTSYMPJ.2010.5680224