DocumentCode :
1937633
Title :
Development of the RIT infrastructure for design, fabrication and testing of small multichip modules
Author :
Mukund, P.R. ; Pearson, R.E.
Author_Institution :
Rochester Inst. of Technol., NY, USA
fYear :
1993
fDate :
15-18 Mar 1993
Firstpage :
58
Lastpage :
60
Abstract :
The infrastructural work in progress at the Rochester Institute of Technology in the area of the multichip modules is described. Facilities for design, fabrication and testing are being developed. Present capabilities as well as future goals are presented. The MCM effort is a joint effort between the Electrical Engineering department and the Microelectronic department. Issues related to design, simulation (electrical and thermal) and testing are being addressed in the Electrical Engineering department. Mask making, fabrication, and final packaging are being handled by the Microelectronic Engineering department. The facilities, technology and projects (ongoing and future) in this endeavor are considered
Keywords :
design engineering; integrated circuit technology; integrated circuit testing; masks; multichip modules; project management; MCM fabrication; MCM testing; RIT infrastructure; electrical simulation; mask fabrication; multichip module design; packaging; thermal simulation; Bonding; Dielectric substrates; Electronic packaging thermal management; Fabrication; Instruments; Logic programming; Microelectronics; Multichip modules; Polyimides; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multi-Chip Module Conference, 1993. MCMC-93, Proceedings., 1993 IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-3540-1
Type :
conf
DOI :
10.1109/MCMC.1993.302151
Filename :
302151
Link To Document :
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