• DocumentCode
    1937776
  • Title

    Design and performance evaluation of overcurrent protection schemes for silicon carbide (SiC) power MOSFETs

  • Author

    Zhiqiang Wang ; Xiaojie Shi ; Yang Xue ; Tolbert, Leon M. ; Blalock, Benjamin J. ; Wang, F.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
  • fYear
    2013
  • fDate
    15-19 Sept. 2013
  • Firstpage
    5418
  • Lastpage
    5425
  • Abstract
    Overcurrent protection of silicon carbide (SiC) MOSFETs remains a challenge due to lack of practical knowledge. This paper presents two overcurrent protection methods to improve the reliability and overall cost of the SiC MOSFET based converter. First, a solid state circuit breaker (SSCB) composed primarily by a Si IGBT and a commercial gate driver IC is connected in series with the DC bus to detect and clear overcurrent faults. Second, the desaturation technique using a sensing diode to detect the drain-source voltage under overcurrent faults is implemented as well. The design considerations and potential issues of the protection methods are described and analyzed in detail. A phase-leg configuration based step-down converter is built to evaluate the performance of the proposed protection schemes under various conditions, considering variation of fault type, decoupling capacitance, protection circuit parameters, etc. Finally, a comparison is made in terms of fault response time, temperature dependent characteristics, and applications to help designers select a proper protection method.
  • Keywords
    MOSFET; circuit breakers; driver circuits; overcurrent protection; power convertors; power transistors; silicon compounds; DC bus; IGBT; SSCB; SiC; commercial gate driver IC; decoupling capacitance; desaturation technique; drain-source voltage; fault response time; overcurrent faults; overcurrent protection schemes; performance evaluation; phase-leg configuration-based step-down converter; power MOSFET; protection circuit parameters; sensing diode; solid state circuit breaker; temperature dependent characteristics; Capacitance; Capacitors; Circuit faults; Insulated gate bipolar transistors; Logic gates; MOSFET; Silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/ECCE.2013.6647436
  • Filename
    6647436