Title :
Top-level validation of system-on-chip in Esterel Studio
Author :
Berry, Gérard ; Blanc, Lionel ; Bouali, Amar ; Dormoy, J.
Author_Institution :
Esterel Technol., Villeneuve-Loubet, France
Abstract :
We present a new tool-supported methodology for system on chip top-level validation (TLV). The addressed problem is the systematic validation of IP interaction to ensure correct global functional behavior of a SoC design, assuming that each IP has been individually validated. The goal is to generate functional tests for the final design that cover the interaction behavior in a systematic, well-defined, and complete way. The typical problem to be found is incorrect inter-IP data flow due to misconfiguration or missynchronization of IPs. The tool is Esterel Studio, a design and verification environment based on the SyncCharts hierarchical concurrent finite state machine (HFSM) formalism. SynchCharts are a graphical variant of the Esterel high-level synchronous programming language, which is used to specify and synthesize circuits and embedded software.
Keywords :
finite state machines; formal verification; high level synthesis; system-on-chip; Esterel Studio; SyncCharts; formal verification; functional tests; hierarchical concurrent finite state machine; high-level synchronous programming language; inter-IP data flow; logic design; system-on-chip; tool-supported methodology; top-level validation; Automata; Automatic testing; Boolean functions; Computer languages; Data structures; Engines; Libraries; System testing; System-on-a-chip; World Wide Web;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2002. Seventh IEEE International
Print_ISBN :
0-7803-7655-2
DOI :
10.1109/HLDVT.2002.1224425