DocumentCode :
1938112
Title :
Segmenting Point Sets
Author :
Yamazaki, Ichitaro ; Natarajan, Vijay ; Bai, Zhaojun ; Hamann, Bernd
Author_Institution :
Inst. for Data Anal. & Visualization, California Univ., Davis, CA
fYear :
2006
fDate :
14-16 June 2006
Firstpage :
6
Lastpage :
6
Abstract :
Extracting features from point sets is becoming increasingly important for purposes like model classification, matching, and exploration. We introduce a technique for segmenting a point-sampled surface into distinct features without explicit construction of a mesh or other surface representation. Our approach achieves computational efficiency through a three-phase segmentation process. The first phase of the process uses a topo-logical approach to define features and coarsens the input, resulting in a set of supernodes, each one representing a collection of input points. A graph cut is employed in the second phase to bisect the set of supernodes. Similarity between supernodes is computed as a weighted combination of geodesic distances and connectivity. Repeated application of the graph cut results in a hierarchical segmentation of the point input. In the last phase, a segmentation of the original point set is constructed by refining the segmentation of the supernodes based on their associated feature sizes. We apply our segmentation algorithm on laser-scanned models to evaluate its ability to capture geometric features in complex data sets
Keywords :
differential geometry; feature extraction; image segmentation; mesh generation; feature extraction; geodesic distance; point set segmentation; surface representation; three-phase segmentation process; Computational efficiency; Computer science; Data analysis; Data mining; Data visualization; Feature extraction; Geophysics computing; Laser beam cutting; Shape; Spectral analysis; features; geodesic distance; hierarchical segmentation.; normalized cut; point sets; sampling; spectral analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Shape Modeling and Applications, 2006. SMI 2006. IEEE International Conference on
Conference_Location :
Matsushima
Print_ISBN :
0-7695-2591-1
Type :
conf
DOI :
10.1109/SMI.2006.33
Filename :
1631190
Link To Document :
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