• DocumentCode
    1938192
  • Title

    800 K gates of random logic in four months: discussion on design methodologies based on “IDEFIX” ASIC experience

  • Author

    Gastaldello, S. ; Traverso, Giovanni ; Käse, R.

  • fYear
    1998
  • fDate
    13-16 Sep 1998
  • Firstpage
    187
  • Lastpage
    191
  • Abstract
    Reusability of basic building blocks is an important and effective goal in ASIC design: it speeds up the design, it minimizes the overall bug probability, it eases documentation and maintenance of core functions. Nevertheless, this approach means also a “black box” management, requiring some extra efforts in the implementation phase. Alcatel and Toshiba proved a solution to cope with the lack of knowledge and control of re-used blocks. This methodology seems to be effective, especially for million gates designs in deep submicron technologies. This paper discusses a real ASIC design case, where classical issues were combined: tough schedule; large glue logic (800 K netlist gates), with high connectivity; many clock domains (65 clocks), with many interactions; 50% reuse of old building blocks, many from netlist. The proposed flow improves by shortening design time, achieving high synthesis efficiency without usage of time consuming CRWC methodology, achieving high layout efficiency bypassing time consuming (and sometimes misleading) floorplanning /hierarchical methodologies
  • Keywords
    VLSI; application specific integrated circuits; circuit CAD; clocks; design for testability; integrated circuit design; logic CAD; ASIC experience; Alcatel; IDEFIX; Toshiba; clock domains; connectivity; core functions; deep submicron technologies; glue logic; layout efficiency; overall bug probability; random logic; synthesis efficiency; Application specific integrated circuits; Automatic test pattern generation; Buildings; Circuit synthesis; Clocks; Design methodology; Hardware design languages; Logic design; Logic gates; Research and development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference 1998. Proceedings. Eleventh Annual IEEE International
  • Conference_Location
    Rochester, NY
  • ISSN
    1063-0988
  • Print_ISBN
    0-7803-4980-6
  • Type

    conf

  • DOI
    10.1109/ASIC.1998.722894
  • Filename
    722894