DocumentCode
1938338
Title
Formal verification of embedded system designs at multiple levels of abstraction
Author
Chen, Xi ; Chen, Fang ; Hsieh, Harry ; Balarin, Felice ; Watanabe, Yosinori
Author_Institution
California Univ., Riverside, CA, USA
fYear
2002
fDate
27-29 Oct. 2002
Firstpage
125
Lastpage
130
Abstract
Embedded electronics today are becoming increasingly complex, which makes their design and analysis more and more difficult. An important approach to overcome the increasing complexity is to divide the system design procedure into different but interrelated stages, and represent system designs with description at different levels of abstraction. Design and analysis tools at each stages can then be more effectively applied onto the designs at particular level of abstraction. In this paper, we focus on the formal verification of embedded system designs at multiple levels of abstraction, enabled by the Metropolis design environment. Based on Metropolis framework and the model checker SPIN, a translation mechanism from Metropolis design to Promela description is presented and an automatic translator is developed accordingly. We discuss the challenges and solutions in semantically translating from an object-based system design language to a procedural verification language. To demonstrate the correctness and effectiveness of our approach for formal verification, we verify properties of typical producer-consumer systems.
Keywords
embedded systems; formal verification; hardware description languages; Metropolis design environment; Promela description; SPIN model checker; automatic translator; correctness; embedded system designs; formal verification; multiple abstraction levels; object-based system design language; procedural verification language; producer-consumer systems; translation mechanism; Analytical models; Computational modeling; Design methodology; Embedded system; Formal verification; Grounding; High level languages; Laboratories; Manufactured products; Refining;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Level Design Validation and Test Workshop, 2002. Seventh IEEE International
Print_ISBN
0-7803-7655-2
Type
conf
DOI
10.1109/HLDVT.2002.1224441
Filename
1224441
Link To Document