Title :
Test generation for hardware-software covalidation using non-linear programming
Author :
Xin, Fei ; Harris, Lan G.
Author_Institution :
Massachusetts Univ., Amherst, MA, USA
Abstract :
Hardware-software covalidation involves the cosimulation of a system description with a functional test sequence. Functional test generation is heavily dependent on manual interaction, making it a time-consuming and expensive process. We present an automatic test generation technique to detect design errors in hardware-software systems. The design errors targeted are those caused by incorrect synchronization between concurrent tasks/processes whose detection is dependent on event timing. We formulate the test generation problem as a nonlinear program on integer variables and we use a public domain finite domain solver to solve the problem. We present the formulation and show the results of test generation for a number of potential design errors.
Keywords :
automatic test pattern generation; formal verification; hardware-software codesign; logic testing; nonlinear programming; public domain software; automatic test generation; cosimulation; event timing; functional test generation; functional test sequence; hardware-software covalidation; integer variables; nonlinear programming; potential design errors; public domain finite domain solver; Automatic test pattern generation; Error correction; Fault detection; Fault diagnosis; Signal processing; Software systems; Software testing; System testing; Test pattern generators; Timing;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2002. Seventh IEEE International
Print_ISBN :
0-7803-7655-2
DOI :
10.1109/HLDVT.2002.1224449