Title :
The development of Cleaving — DBG + CMP process
Author :
Takyu, Shinya ; Kiritani, Mika ; Kurosawa, Tetsuya ; Shimizu, Noriko
Author_Institution :
Semicond. Co., Center for Semicond. R&D, Toshiba Corp., Kawasaki, Japan
Abstract :
As telecommunication equipment that supports high-level information networks is being made portable, the requirements for telecommunication equipment to be small and lightweight are becoming stricter. Thus, miniaturization of semiconductor devices is necessary, and wafer dicing and chip thinning technologies are important key technologies to achieve it. Wafers are thinned by mechanical in-feed grinding using a grindstone containing diamond particles, and wafers are divided by mechanical blade dicing using a diamond blade. However, mechanical processes using diamond grits leave damage such as chipping, saw mark or residual strain on chip surfaces; thus, chip strength decreases. At chip thicknesses of 50 to 200 μm, such damage has to be avoided. In this study, novel manufacturing process steps for thin semiconductor devices are followed. 1) Irradiating dicing lines of wafer with a laser instead of blade dicing 2) Laminating the wafer surface protective tape 3) Cleaving the wafer into chips 4) Grinding until the final thickness + 5 um, that is simular DBG 5) Mirror finishing by CMP 6) Tape mounting the wafer onto dicing tape or DAF (Die Attach Film) 7) Removing the wafer surface protective tape. We named these process steps Cleaving - DBG.
Keywords :
blades; chemical mechanical polishing; grinding; semiconductor device manufacture; surface finishing; telecommunication equipment; CMP process; chip thinning technology; cleaving-DBG process; diamond blade; dicing line irradiation; die attach film; grindstone; information network; laser; manufacturing process step; mechanical blade dicing; mechanical in-feed grinding; mechanical process; mirror finishing; residual strain; saw mark; semiconductor device miniaturization; tape mounting; telecommunication equipment; thin semiconductor device; wafer dicing; wafer surface protective tape laminating; wafer surface protective tape removal; Blades; Electronic components; Finishing; Mirrors; Surface cracks; Surface emitting lasers;
Conference_Titel :
CPMT Symposium Japan, 2010 IEEE
Conference_Location :
Tokyo
Print_ISBN :
978-1-4244-7593-3
DOI :
10.1109/CPMTSYMPJ.2010.5680274