DocumentCode :
1938644
Title :
Fast Sampling of Implicit Surfaces by Particle Systems
Author :
Levet, Florian ; Granier, Xavier ; Schlick, Christophe
Author_Institution :
LaBRI-INRIA, Bordeaux I Univ.
fYear :
2006
fDate :
14-16 June 2006
Firstpage :
39
Lastpage :
39
Abstract :
Particle systems, as originally proposed by Witkin and Heckbert, are a powerful way to sample implicit surfaces since they generate almost evenly distributed samples over the surface, thanks to a global minimization of an energy criterion. Nonetheless, due to the computational cost of the relaxation process, the sampling process becomes rather expensive when the number of samples exceeds a few thousands. In this paper, we propose a technique that only relies on a pure geometry processing which enables us to rapidly generate the set of final particles (e.g., half a second to generate 5,000 particles for an analytic implicit surface) with near-optimal positions. Because of its characteristics, the technique does not need the usual split-and-death criterion any more and only about ten relaxation steps are necessary to get a high quality sampling. Either uniform or non-uniform sampling can be performed with our technique
Keywords :
computational geometry; image sampling; relaxation theory; surface fitting; distributed samples; fast sampling technique; geometry processing; global minimization; particle systems; relaxation process; split-and-death criterion; Anisotropic magnetoresistance; Computational efficiency; Convergence; Distributed power generation; Geometry; Power generation; Power system modeling; Sampling methods; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Shape Modeling and Applications, 2006. SMI 2006. IEEE International Conference on
Conference_Location :
Matsushima
Print_ISBN :
0-7695-2591-1
Type :
conf
DOI :
10.1109/SMI.2006.13
Filename :
1631216
Link To Document :
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