Title :
Accurate closed-form expressions for the frequency-dependent line parameters of coupled on-chip interconnects on silicon substrate
Author :
Lan, Hai ; Luoh, Amy ; Weisshaar, Andreas
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Abstract :
Accurate closed-form expressions for the frequency-dependent [R], [L], [G], [C] line parameters of coupled on-chip interconnects on lossy silicon substrate are presented. The closed-form expressions for the frequency-dependent series impedance parameters are obtained using a complex image method. The frequency-dependent shunt admittance parameters are expressed using high- and low-frequency asymptotic static solutions. The proposed closed-from expressions are shown to be in good agreement with both quasi-static and full-wave electromagnetic solutions
Keywords :
elemental semiconductors; integrated circuit interconnections; integrated circuit modelling; silicon; Si; asymptotic static solution; closed-form expression; complex image method; coupled on-chip interconnects; frequency-dependent line parameters; lossy silicon substrate; series impedance; shunt admittance; Admittance; Closed-form solution; Conductivity; Design automation; Eddy currents; Frequency; Impedance; Integrated circuit interconnections; Microstrip; Silicon;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2001
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-7024-4
DOI :
10.1109/EPEP.2001.967676
