DocumentCode :
1939045
Title :
Noise tolerant low power dynamic TSPCL D flip-flops
Author :
Elgamel, Mohamed ; Darwish, Tarek ; Bayoumi, Magdy
Author_Institution :
Center for Adv. Comput. Studies (CACS), Univ. of Louisiana, Lafayette, LA, USA
fYear :
2002
fDate :
2002
Firstpage :
80
Lastpage :
85
Abstract :
The extensive use of a dynamic circuit techniques for higher performance has already been implemented in many circuits like microprocessors. With the scaling down to deep submicron technology and the move towards dynamic circuit techniques, noise immunity is becoming an important metric like power, speed, and area. This paper proposes a technique to achieve low energy consumption in TSPCL D flip-flops. The paper studies some published flip-flops and carries out a modification that reduces the switching activity of some internal nodes, causing a big saving in power consumption. The proposed flip-flop is characterized and compared with those published ones for reliability and energy efficiency. Comparison for speed, power consumption, and noise tolerance is also presented. The average noise threshold energy (ANTE) and the energy normalized ANTE metrics are used for quantifying the noise immunity and energy efficiency, respectively of flip-flops. Results using 0.18 μm CMOS technology and HSPICE for simulation, show that the proposed TSPCL D flip-flop achieves reduction in power dissipation ranging from 4.6% to 80% depending on the input pattern and the technology in use. The noise immunization curves show that the modified flip-flop is more susceptible to noise. Hence, one of the known noise immunization techniques should be applied
Keywords :
CMOS logic circuits; VLSI; flip-flops; integrated circuit noise; low-power electronics; 0.18 micron; CMOS technology; TSPCL D flip-flops; average noise threshold energy metric; dynamic circuit techniques; energy efficiency; energy normalized ANTE metric; low energy consumption; low power dynamic flip-flops; noise immunity; noise tolerant flip-flops; power consumption reduction; reliability; switching activity; true single phase clocked logic; Computer Society; Flip-flops; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI, 2002. Proceedings. IEEE Computer Society Annual Symposium on
Conference_Location :
Pittsburgh, PA
Print_ISBN :
0-7695-1486-3
Type :
conf
DOI :
10.1109/ISVLSI.2002.1016880
Filename :
1016880
Link To Document :
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