• DocumentCode
    1939122
  • Title

    Build-up electrical insulation material with low-dielectric tangent, low-CTE and low-surface roughness

  • Author

    Suzuki, Isao ; Tanaka, Toshiaki ; Uenishi, Akihiro ; Kobayashi, Takayuki ; Murakami, Junnosuke

  • Author_Institution
    R&D Center, Sekisui Chem. Co., Ltd., Tsukuba, Japan
  • fYear
    2010
  • fDate
    24-26 Aug. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    With the increasing speed of information and communications equipment in recent years, together with high-speed signal processing of LSIs, there is a requirement for build-up electrical insulation materials to be used as IC package substrates with low-dielectric tangent, and to reduce the dielectric loss to achieve low transmission loss in the high-frequency GHz bands. At the same time, there is an increasing need for low-CTEs (Coefficient of Thermal Expansion) to ensure highly reliable substrates. With our formulation technology, we have developed a next-generation film-shaped build-up electrical insulation material compatible with high-frequency signal transmission by using composition of practical thermosetting epoxy resin, that has realized both a low-dielectric tangent and a low-CTE at the same time. Furthermore, this material can show a low-surface roughness after the film desmear process. It is thus expected to help reduce not only the dielectric loss by low-dielectric tangent but also the conductor loss caused by the skin effect, and promote the fine line formation by SAP (Semi Additive Process).
  • Keywords
    dielectric losses; dielectric materials; epoxy insulation; integrated circuit packaging; skin effect; surface roughness; thermal expansion; IC package substrates; build up electrical insulation material; conductor loss; dielectric loss; film desmear process; fine line formation; high frequency band; high speed signal processing; highly reliable substrate; low dielectric tangent; low surface roughness; practical thermosetting epoxy resin; semi additive process; skin effect; thermal expansion coefficient; transmission loss; Copper; Dielectric losses; Insulation; Propagation losses; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    CPMT Symposium Japan, 2010 IEEE
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4244-7593-3
  • Type

    conf

  • DOI
    10.1109/CPMTSYMPJ.2010.5680298
  • Filename
    5680298