Title :
Dynamic circuit synthesis using the Owens tool set
Author :
Irwin, Mary Jane ; Chen, Rita Yu
Author_Institution :
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
This paper overviews the Owens CAD tool set developed at Penn State University and illustrates its ability to synthesize dynamic CMOS circuits. The CAD system includes: a cell compiler with transistor sizing and I/O direction annotation; a simulation tool based on the switch-level logic model; tools for multi-level logic optimization; and tools for format conversion which establish a connection with the netlist specification, truth tables, Boolean equations and VHDL. The Owens tool set is able to implement various CMOS structures such as static gates, dynamic gates and transmission gates. In particular, since it supports transistor sizing, it creates an efficient design environment for dynamic circuit implementation and optimization. To show this feature, this paper illustrates the application of the Owens tool set to the design of zipper CMOS adders and Manchester carry chain adders which are typical dynamic circuits
Keywords :
Boolean functions; CMOS logic circuits; adders; cellular arrays; circuit optimisation; circuit simulation; hardware description languages; logic CAD; Boolean equations; CMOS circuits; I/O direction annotation; Manchester carry chain adders; Owens CAD tool set; VHDL; cell compiler; design environment; dynamic circuit implementation; dynamic circuit synthesis; dynamic gates; format conversion; multi-level logic optimization; netlist specification; simulation tool; static gates; switch-level logic model; transistor sizing; transmission gates; truth tables; zipper CMOS adders; Adders; Boolean functions; CMOS logic circuits; Circuit simulation; Circuit synthesis; Design optimization; Equations; Logic design; Optimizing compilers; Semiconductor device modeling;
Conference_Titel :
ASIC Conference 1998. Proceedings. Eleventh Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-4980-6
DOI :
10.1109/ASIC.1998.722903