Title :
Silicon Photonic Spectrometer for Accurate Peak Detection Using the Vernier Effect and Time-Domain Multiplexing
Author :
Ruocco, Alfonso ; Van Thourhout, Dries ; Bogaerts, W.
Author_Institution :
Dept. of Inf. Technol., IMEC, Ghent Univ., Ghent, Belgium
Abstract :
We present a silicon-on-insulator spectrometer for wavelength peak detection operating in a 20-nm wavelength band around 1550 nm with an average accuracy of 12 pm. The silicon photonic integrated circuit occupies a footprint of 250 × 700 μm2 and is composed of a passive-arrayed waveguide grating (AWG) and an array of thermo-optic Mach-Zehnder interferometer switches. The AWG multiplexes multiple inputs and outputs with a vernier design that shifts the spectral response of the different inputs. In this demonstration, we use five output channels and four input channels, with a 4.0-nm channel spacing and 5.0-nm channel spacing, respectively. The responses to the different inputs are disentangled at the outputs by time-multiplexing the inputs with the switches. We demonstrate a more than tenfold improvement in peak detection accuracy using the Vernier effect, from nm range using a single input to picometers range using the four inputs.
Keywords :
Mach-Zehnder interferometers; arrayed waveguide gratings; integrated optics; nanophotonics; optical communication equipment; optical design techniques; optical switches; photodetectors; silicon; silicon-on-insulator; spectral line shift; thermo-optical devices; time division multiplexing; Si; Vernier design; distance 4.0 nm; distance 5.0 nm; passive-arrayed waveguide grating; silicon photonic integrated circuit; silicon-on-insulator photonic spectrometer; spectral shifts; thermo-optic Mach-Zehnder interferometer switches; time-domain multiplexing; wavelength 20 nm; wavelength peak detection; Accuracy; Arrayed waveguide gratings; Channel spacing; Couplers; Integrated circuit modeling; Optical switches; Arrayed waveguide grating; silicon photonics; spectrometer;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2014.2346585