Title :
Non-planar log-periodic antenna feed for integration with a cryogenic microwave amplifier
Author_Institution :
Radio Astron. Lab., California Univ., Berkeley, CA, USA
Abstract :
The bandwidth of a microwave reflector telescope is limited by the size and figure accuracy of the mirror elements and by the feed which couples focused radiation to the receiver. A single or hybrid-mode feedhorn can efficiently illuminate a telescope aperture with low ohmic loss. Its gain varies quadratically with frequency, however, limiting its effective bandwidth to less than an octave. A log-periodic antenna (LP) can illuminate a telescope aperture over multi-octave bandwidths, but it has greater spillover and ohmic loss than a well-designed feedhorn. This paper describes a non-planar log-periodic antenna feed to which cryogenic electronics can be attached without the need for a long, lossy section of transmission line. With appropriate reflector optics to minimize defocusing with phase travel and baffles to redirect sidelobes onto the sky, this antenna offers a low noise, wideband alternative microwave feed for astronomical and SETI applications. It is currently being adapted for use on the Allen telescope array.
Keywords :
antenna feeds; cryogenic electronics; log periodic antennas; microwave amplifiers; microwave antennas; radiotelescopes; Allen telescope array; SETI applications; astronomical applications; baffles; bandwidth; cryogenic electronics; cryogenic microwave amplifier; focused radiation; hybrid-mode feedhorn; lossy transmission line; low noise antenna; microwave reflector telescope; mirror elements accuracy; mirror elements size; nonplanar log-periodic antenna feed; ohmic loss; phase travel; reflector optics; sidelobes; spillover; telescope aperture illumination; wideband microwave feed; Apertures; Bandwidth; Broadband antennas; Cryogenics; Feeds; Log periodic antennas; Microwave amplifiers; Optical losses; Optical noise; Telescopes;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2002. IEEE
Print_ISBN :
0-7803-7330-8
DOI :
10.1109/APS.2002.1016945