Radiation effects studies on thin film TiO2 memristor devices

Memristor devices have been identified as potential replacements for a variety of memory applications and may also be suitable for space applications. In this work, we present a review of radiation testing on TiO2-based memristor devices. The experimental results from three previous studies are reviewed and coupled here with modeling to gain a more complete understanding of the energy deposition and resulting effects on the electrical performance of the device. In addition, we discuss the implications of having a nanometer scaled thin film device and how that affects the energy deposition from the various radiation sources.