A fast MoM-PML formalism to model scattering from 2D conductors in microstrip substrates

A fast method of moments formalism is presented to model electromagnetic scattering from two-dimensional metallic conductors embedded in microstrip substrates. The technique relies on perfectly matched layers to obtain closed-form series of leaky and Berenger modes, composing the Green´s function of the substrate. After a brief analysis of the series´ convergence in the far and near fields, an efficient summation scheme is proposed, relying on the Shanks transform. The closed-form series can be applied to calculate all interactions, except for the selfpatch contribution. The latter is approximated with good accuracy by using the closed-form quasi-static part of the Green´s function.